Figure 3: Memory characteristics of flexible 1D–1R cell.

(a) I–V curve of 1D–1R cell before, after bending, twisted and rolled. (b) I–V characteristic of 1D–1R cell under gradual bending and statistical ION/IOFF ratio distribution of 1D–1R cell under gradual bending. (c) I–V characteristic of 1D–1R cell and statistical ION/IOFF ratio distribution during gradual twisting. (d) ION/IOFF ratio and leakage current of diode until device malfunction.