Figure 4: Temperature-dependent resistivity and resonant X-ray diffraction.
From: Heterointerface engineered electronic and magnetic phases of NdNiO3 thin films
Left axis corresponds to resistivity. Cooling resistivity data are shown as dashed curves for samples that have thermal hysteresis. Cooling resistivity data at ε=+0.3% are included in the inset to demonstrate the absence of hysteresis. Right axis is for diffraction intensity (open circles) of the k=(1/4,1/4,1/4) reflection for samples where this ordering peak is observed. Dashed lines are used as guides for eyes for the diffraction intensity data.
