Figure 3: Mapping of the LDOS measured near a Cu impurity.

(a) The topographic image of a Cu impurity, the field of view dimensions are 3.5 × 3.5 nm. (a) Scale bar, 1 nm. (b–f) The mapping of the LDOS measured at bias voltages of −5, −0.6, 0.6, 1.8 and 5 mV, respectively. One can see that the spatial influence of a Cu impurity is about 20 Å.