Figure 4: X-rays data.
From: Spin-to-charge conversion using Rashba coupling at the interface between non-magnetic materials
(a) XRR scans of the Ag(t)/Bi (8)//SiO2 samples (thicknesses in nm). Red lines are theoretical fits. The thicknesses are close to the nominal ones, but the roughness at the interfaces is between 1.5 and 3.5 nm. (b) XRD scans of the Ag(20)/Bi(8)//SiO2 sample. The top curve is the standard θ–2θ curve and the bottom curve is the acquisition with an off axis of 1 degree to reduce the intensity of the Si substrate. A strong growth texture of rhombohedral Bi along the (001) direction is found (corresponding to (111) in the primitive rhombohedral cell). The silver layer grows in the cubic crystallography phase with a texture in the (220) direction and a much smaller contribution of the (200) texture.
