Figure 5: Scanning transmission electron microscopy experiments.
From: Spin-to-charge conversion using Rashba coupling at the interface between non-magnetic materials
(a) HAADF image of the NiFe(15)/Ag(20)/Bi(8) sample (thicknesses in nm).The scale bar is 50 nm. (b) EDX integrated signal profiles of Si, Bi, Ag and Ni obtained through line scans crossing the layers.
