Figure 5: AC-HRTEM characterization of defect structures.
From: Effect of defects on the intrinsic strength and stiffness of graphene
Images of a typical graphene sheet in (a) sp3-type and (b) vacancy-type defect regime. Polymer residue associated with the transfer process onto the TEM grid is indicated by arrows. The defective graphene of the vacancy-type defect regime contains an abundance of nanocavities (that is, etch pits), while the defective graphene of the sp3-type defect regime shows a contrasting absence of such cavities. The black dots circled with dashed lines in a and b are oxygen adatoms. The insets of a show the experimentally obtained TEM image (upper) and the corresponding simulated image (lower) of oxygen atoms bonded to carbon forming sp3 point defects. Scale bars, 2 nm (a,b).
