Figure 1: In situ compression test on a submicron-sized single-crystal Mg pillar.
From: Twinning-like lattice reorientation without a crystallographic twinning plane
(a) Schematic illustration of the crystal, compression-loaded in 
orientation. The 
plane is highlighted in red. (b) SADP for ideal 
twins. (c,d) Dark-field TEM images showing the pillar before and after loading, respectively. Scale bars, 400 nm. (e) SADP taken from the framed area, demonstrating that 
diffraction spots are separated instead of overlapping with each other. The zone axis is 
for parent lattice. (f) The corresponding stress–strain curve.
