Figure 1: Thin-film SP modes measured by EELS.
From: Universal dispersion of surface plasmons in flat nanostructures
(a) Sketch of the sample geometry, (1) a 50-nm-thick silver film on a 15-nm-thick Si3N4 substrate, (2) the same with an additional 22-nm-thick SiO2 layer. (b, top) Calculated dispersion relations of antisymmetric (solid lines) and symmetric (dashed lines) SP modes SPA and SPS, respectively, for both sample geometries (1), red and (2), pink. (b, bottom) EEL spectra acquired on both systems (1) and (2). (c) Calculated magnetic field profile for FA and FS for sample geometry (1).
