Figure 2: Photoemission spectra for a cleaved BiTeI surface.
From: Mapping polarization induced surface band bending on the Rashba semiconductor BiTeI
(a) An illustration of the XPS measurement using SPEM. (b) XPS spectrum showing peaks for the constituent elements of BiTeI. (c) Zoom-in on the Bi 5d peaks, showing the separation into two contributions with a splitting in binding energy of about 0.8 eV.
