Figure 5: Ultra flexible photonic memory device.

(a) Transfer characteristics of the IR photonic memory device with low voltage operation. Inset: optical image of the flexible memory array on a PEN film. (b) Endurance characteristics of the memory device as a function of program/erase cycles. Inset: test pulse sequence for the endurance test. (c) Data retention property of the memory device. Inset: test pulse sequence for the retention test. (d) Transfer curves of the flexible memory device before, during and after the bending test. Inset: illustration of the memory cell under bending test.