Figure 1: Intensity analysis of Aberration Corrected Electron Microscope images. | Nature Communications

Figure 1: Intensity analysis of Aberration Corrected Electron Microscope images.

From: Low-temperature carbon monoxide oxidation catalysed by regenerable atomically dispersed palladium on alumina

Figure 1

The images were obtained from a La-stabilized γ-alumina support sample with a 2.5 wt% Pd loading. (a) A typical region of the sample, with a Pd-metal particle surrounded by atomically dispersed Pd and La. (b) An enlarged region from a, showing two regions containing atomically dispersed species. (c) Colourized intensity maps from regions 1 and 2. (d) Two-dimensional (2D) Gaussian-function fits (fine-mesh) to the intensity maps in c. (e,f) Normalized intensity distributions, obtained from 2D Gaussian-function fits of images obtained from La-alumina (e) and Pd-La-alumina (f) showing well-resolved peaks corresponding to Pd and La electron backscatter intensity in the case of the Pd-La-alumina sample. The red lines represent Gaussian-function least-squares fits to the intensity distributions.

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