Figure 3: KPFM results for short-circuit conditions.
From: Real-space observation of unbalanced charge distribution inside a perovskite-sensitized solar cell
(a) Topography image of the device with a ≈200 nm thick perovskite capping layer (b) Corresponding CPD maps and (c) line profiles for short-circuit conditions before illumination (black line), during illumination (red line) and immediately after illumination (blue line). The increase in potential after turning on the illumination corresponds to an accumulation of holes inside the capping layer (red arrow). After switching off the light, trapped holes become visible inside the mesoporous structure with an increase in potential (>h+<) and trapped electrons become visible in the perovskite capping layer (>e–<).
