Figure 4: KPFM measurements for short-circuit conditions at thinner capping layer thicknesses.
From: Real-space observation of unbalanced charge distribution inside a perovskite-sensitized solar cell
(a) The CPD line profiles recorded at a capping layer thickness of ≈140 nm showed a decreased light-induced charging in the capping layer compared with the 200-nm thick one. (b) CPD line profiles at an area where the perovskite capping layer was ≈70 nm. Here, the CPD reached a maximum at the mesoporous–perovskite capping layer interface.
