Figure 5: LEEM and microprobe-LEED experiments.

df-LEEM image of (a) an epitaxial and (d) a rotated Gr flake (Start voltage: 40 eV). The two images, which were obtained using the corresponding first order diffraction beams, map the lateral extent of two distinct Gr single-crystals within the same microscopic region of the sample. (b,e) μ-LEED pattern from the same two single-crystals, as measured by probing an area of diameter 500 nm. Electron energy is 50 eV. Waterfall plot of a cross-section though the zero-order diffraction spot of (c) an epitaxial and (f) a rotated Gr flake as a function of the electron energy.