Figure 2: Microscopic characterizations of the nanotube arrays assembled using the fringing-field dielectrophoresis. | Nature Communications

Figure 2: Microscopic characterizations of the nanotube arrays assembled using the fringing-field dielectrophoresis.

From: Fringing-field dielectrophoretic assembly of ultrahigh-density semiconducting nanotube arrays with a self-limited pitch

Figure 2

(a) SEM image of arrays assembled from dilute nanotube solution. Scale bar, 1 μm. (b–d) SEM images of arrays assembled from the concentrated nanotube solution with low (b, scale bar, 1 μm), medium (c, scale bar, 200 nm) and high (d, scale bar, 100 nm) magnifications. The height of the frame d is 100 nm. (e) AFM image of ultrahigh-density semiconducting nanotube arrays. Scale bar, 250 nm. Bottom frame shows the magnified cross-sectional height (H) profile, with red lines as a visual guide marking the position of each nanotube inside the array.

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