Figure 4: XRD results.
From: Growth and modelling of spherical crystalline morphologies of molecular materials
(a) In situ XRD measurement during the film growth showed that the diffraction peak intensities continuously increase as a function of film thickness, regardless of the morphology of the film surface (smooth, wavy, lobes and ferns). Diffraction intensity data at four different film thicknesses (nozzle dwell time: 1, 6, 9 and 15 min) are shown, and the scanning elecrtron microscopy image insets describe the morphology of the film surface at each growth stage. Scale bar 1 μm. (b) Full 2θ scan of deposit with lobe microstructure (red curve) and simulated powder diffraction pattern from its bulk structure21 (black curve) showing good agreement between their peak positions. Inset depicts the micrographs of SubPc bulk powder and deposit. Scale bar 10 μm.
