Figure 3: Optoelectronic performance of LV and SSW networks.

(a) Comparison with other networks and ITO (~150 nm) at the vacuum wavelength of 550 nm. The lines represent fits of equation (1) to the clusters of data points, which determine the corresponding figures of merit F. The error bars are smaller than the symbol sizes. (b) Transmittance versus radiation wavelength for the SSW networks and the standard, 150-nm thick ITO film. (c,d) Demonstration of the networks optical transparency for the LV, SSW(1), SSW(2) and SSW(4) networks, respectively. SSW(1), SSW(2) and SSW(4) denote the SSW network films with one, two and four layers, respectively. The scale bars in c–f are 1 cm.