Figure 2: TEM cross-section image and Fourier image analysis.
From: Observation of the intrinsic bandgap behaviour in as-grown epitaxial twisted graphene
(a) TEM image of graphene layers on a 6H-SiC substrate. The red square indicates the region chosen for digital Fourier image analysis. (b) Power spectrum of region within the red square in a. (c) Line profile along the marked region in b. The dashed lines identifying the maxima in c are 2.81 nm−1 apart, corresponding to a spacing of 0.356 nm.
