Figure 1: On-chip testing method for mechanical characterization. | Nature Communications

Figure 1: On-chip testing method for mechanical characterization.

From: Dislocation-mediated relaxation in nanograined columnar palladium films revealed by on-chip time-resolved HRTEM testing

Figure 1

(a) Schematic view of the structures allowing time-resolved TEM observation with 3-mm scale bar. Notches have been milled at every two beams using FIB (see Methods for more details). (b) Stress–strain evolution of different Pd beams under uniaxial tension. The Young’s modulus has been determined by nanoindentation as equal to 120 GPa. The initial strain level εpr before relaxation is indicated in the figure. The inset presents the mean activation volume evolution as a function of the initial strain εpr present in the different beams before relaxation. The activation volume V decreases when the initial strain level increases.

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