Figure 3: DPN patterning and imaging of continuous β-phase stripes.
From: Dip-pen patterning of poly(9,9-dioctylfluorene) chain-conformation-based nano-photonic elements

(a) Confocal PL image of a β-phase stripe element, DPN patterned using decalin ink at a writing speed of 0.1 μm s−1. The image was recorded with PL filtered at 440 nm. (b) AFM topographic profile measured along the path indicated by the dashed line in a. The main panel shows the full film thickness profile, whereas the inset provides a magnified view.