Figure 3: Nano-scale analyses on fibre core.
From: Crystalline silicon core fibres from aluminium core preforms
On the top panel, a–f data are measured inside the core region of the fibre with a yellow core (near location #2 in Fig. 2a). (a) TEM image, the dot is one of the many dots seen on the sample. (b) The diffraction pattern indicates that the sample is mostly amorphous. (c–e) EDX mappings on a, red, green and yellow denote O, Al and Si, respectively. (f) EDX line scan result. The white arrow in e shows the line scanning path corresponding to f. On the bottom panel, g–l data are measured at the core-cladding interface of the fibre with a black core (near location #4 in Fig. 2a). In g, the yellow dashed line indicates the interface between the crystalline part (core) and the amorphous part (clad). The parallel orange lines are {110} faces, and the distance between them is measured 0.192 nm. (h) Taken from crystalline side of the yellow line, and the zone axis has been tilted to <111>. (i–k) EDX mappings on g, red, green and yellow denote O, Al and Si, respectively. l, EDX line scan result. The white arrow in k shows the line scanning path corresponding to l.
