Figure 5: The X-ray diffractive time window achieved with 75 kHz MEMS-based diffractive optics.
From: X-ray photonic microsystems for the manipulation of synchrotron light
The measured dynamic diffraction profile (dots) at Δθ=0 is fitted with 3-Gaussians (lines). The green curve reflects the peaks associated with a dopant layer identical to those observed in the static diffraction profile. This extra feature will not be present when future MEMS fabrication processes eliminate the inclusion of the dopant layer. The resulting Δtw for the prominent Si(400) peak is 2.8±0.4 ns in agreement with that obtained from equation 3 using experimentally obtained values of Δθ(400)=0.0034°, αm=2.69° and fm=74.671 kHz.
