Figure 2: Deformation of the MoS2 monolayer and electromechanical properties of the device.

(a) Deformation of the MoS2 monolayer under different forces applied by the AFM tip. Optical image of the measured MoS2 device (inset) denoting the tested 2.5 × 2.5-μm2 area by a black dashed rectangle. (b) I–Vb curves of the measured MoS2 device under a force applied in the centre of the tested region cycled from 0 to 12.5 nN and back to 0 nN, where the inset reveals the measured current under variable mechanical load at a fixed bias voltage of 0.55 V.