Figure 4: The tip-induced averaging effect in SKPM measurements.
From: Quantitative o perando visualization of the energy band depth profile in solar cells
(a) Schematic illustration of a finite-sized SKPM tip scanning over a cross-section of a multilayered thin-film device; (b) an illustration of the measured SP profile resulted from the convolution of the true profile with the transfer function of the SKPM tip.
