Supplementary Figure 5: Ideal exposure for a phasing experiment with T2R-TTL as a test case.
From: Fast native-SAD phasing for routine macromolecular structure determination
Data sets of 180º were collected at 6 keV with 1.5 × 1010 photons/s with the following oscillation range / exposure time: (a) - 0.1° / 0.025 s; (b) - 0.1° / 0.1 s; (c) - 0.1° / 0.4 s. Data were processed with XDS, and the plots were generated from XDS_ASCII.HKL. Ideal exposure was characterized by strong reflections in the overall count range from 1000 to 10000 reaching the final (I/σ)asymptotic value (marked with dotted lines). These reflections were measured as accurately as possible without unnecessary X-ray exposure, thus optimally balancing overall radiation damage with redundancy.
