Figure 6
From: Faceted interfaces: a key feature to quantitative understanding of transformation morphology

An illustration of an O-line interface (HP) in a fcc/bcc system with . (a) simulated electron diffraction pattern at initial Pitsch OR; (b) simulated diffraction pattern at an O-line OR that is 0.44° from the exact K–S OR, with the HP trace normal to the parallel Δg’s; (c) matching structure of the HP in the plane view; (d) matching structure of the HP in an edge-on view along .