Fig. 4
From: Heterostructure and Q-factor engineering for low-threshold and persistent nanowire lasing
Normalised time-resolved PL maps (left) and emission decays (right) for the selected NL. The blue line is the emission integrated across the whole emission band, while the dotted black line (where relevant) shows the normalised ratio of lasing emission to the total emission on a linear scale (right y-axis). The measurements are taken following below threshold (0.5 Lth, top), close to threshold (1.0 Lth, middle) and above-threshold (1.3 Lth, bottom) excitation. The transient increase in the ratio observed for above threshold excitation close to 1.8 ns is associated with a reflection in the system. A common colour bar is shown for the three maps
