Fig. 2: Theoretical comparison of conventional imaging and super-resolution endo-microscopy.
a, d Samples with 390 nm (a) and 480 nm (d) features. b, e Conventional diffraction-limited point scan imaging of the sample with 390 nm (b) and 490 nm (e) features. The total number of measurements Nm = 4900. c, f Super-resolution endo-microscopy of the sample with 390 nm (c) and 490 nm (f) features. The total number of measurements Nm = 256. g The fidelity of compressive endo-microscopy as a function of an average number of “detected” photons in the presence of shot noise for 390 nm (black line), 480 nm (red line), and 580 nm (green line) features. The dashed green line represents the level of the fidelity at which sub-diffraction details could be resolved. h Gaussian PSF used for the conventional point scan imaging modality. i Example of an experimentally measured and low-pass-filtered speckle-based PSF that was used for super-resolution compressive endo-microscopy. PSFs presented in h and i have the same cutoff frequency of 2NA/λ
