Fig. 3: Laser emission from semiconductor microdisks with surface roughness and boundary defects.
From: Laser particles with omnidirectional emission for cell tracking
a SEM image of a CLP with smooth sidewalls. b–c Slope efficiency (b) and threshold (c) versus orientation angle α of an ensemble of CLPs. Scattering fitting coefficient s = 0.007. Black dashed curve: the theoretical prediction for a perfect microdisk. d SEM image of a CLP with rough sidewalls. e–f Slope efficiency (e) and threshold (f) versus α of CLP ensembles with rough sidewalls. Scattering fitting coefficient s = 0.07. g SEM image of a notched LP with rough sidewalls. h–i Slope efficiency (h) and threshold (i) versus α of notched LP ensembles with rough sidewalls. The lasing wavelengths in (c), (f), and (i) were 1370 ± 10 nm, 1405 ± 10 nm, and 1410 ± 10 nm, respectively. Scattering fitting coefficient s = 0.32. Green curves in b, e, and h: best fit based on Eq. (2) in the log scale
