Fig. 5: EELS, CL, and PINEM amplitude profiles.
From: Spontaneous and stimulated electron–photon interactions in nanoscale plasmonic near fields
Intensity profiles through a 200 keV EELS (1.68 eV), b 20 keV CL (1.72 eV), and c 200 keV PINEM (\(\hbar \omega _{\mathrm{L}}\)= 1.55 eV photon energy) distributions along the symmetry axis of tip II. We also plot model fits assuming Gaussian broadening of the data due to the finite width of the electron beam (dashed curves) and deconvoluted model functions (dotted curves). An impact parameter of d = 0 corresponds to the approximate position of the tip apex derived from the fitting procedure. d BEM calculations of 200 keV EELS (green, hidden behind the PINEM curve), 20 keV CL (blue), and 200 keV PINEM (orange curve) profiles along the tip symmetry axis of the model geometry. The calculated profiles are normalized to their respective amplitudes at the tip apex. As in the experiments, EELS and CL probabilities are calculated for a spectral bandwidth of ±25 meV around the tip resonance at 1.73 eV, while the PINEM interaction strength is calculated for laser polarization along the symmetry axis of the tip at an excitation energy of \(\hbar \omega _{\mathrm{L}}\) = 1.73 eV
