Fig. 7: Mg-δ-doped AlGaN layers with and without In surfactant.
From: Progress on AlGaN-based solar-blind ultraviolet photodetectors and focal plane arrays
a, b Mg and In concentration depth profiles. c Temperature-dependent hole concentrations. The solid lines are fitting curves. d HRXRD (0002) 2θ-ω scan curves. The inset presents the Al-content and Mg concentration depth profiles in the In-surfactant-assisted sample. e Calculated self-consistent valence band diagrams at the quantum-well and graded-barrier interface, as a result of Mg-δ-doping. Reprinted with permission from Jiang et al.76. Copyright 2015 AIP Publishing LLC
