Fig. 3: Spectral modification in sub-micrometric films.

a The difference of normalized spectra before and after the sample interaction in a 300 nm Al film (red line), 100 nm of Si (blue line), and 120 nm of Se (green area) at 42.1 eV with a fluence of 31 J cm⁻². b The measurement is performed in Se film above the M_4,5 absorption edge (at 55 eV) with a fluence of 9 J cm⁻². 〈I_u(E_ph)〉 of the sample, divided by a factor 10, is depicted by the black dotted lines. The horizontal black arrows indicate the shift direction.