Fig. 3: Integrated ultra-high vacuum system for the quantitative modeling of photoemission spectra for interface states.
Left: Thin film growth techniques (e.g., MBE). Right: In-situ photoemission spectroscopy (XPS and/or UPS)
Fig. 3: Integrated ultra-high vacuum system for the quantitative modeling of photoemission spectra for interface states. | Light: Science & Applications
