Fig. 5: Phase- and polarization-resolved near-field measurements.
a Sketch of the experimental set-up, utilizing an aperture-based near-field probe (see inset). b Near-field map of the normalized in-plane field amplitude as well as time-instantaneous field orientation (represented by white arrows) collected 30 nm above a silicon disk of nominal radius 375 nm (highlighted by the white dashed outline) at the wavelength of maximum near-field energy. c \(\left|\leftrightarrow \right\rangle\) field map, consisting of a coherent sum of Ex and Hy, with the detected phase distribution shown as inset. d \(\left|\updownarrow \right\rangle\) field map, consisting of a coherent sum of Ey and − Hx as well as its phase distribution. The white arrows indicate the collected in-plane polarization direction. Both maps are normalized to the maximum field amplitude in b
