Fig. 3: Saturation and dephasing nonlinearities in plexcitons.
From: Interacting plexcitons for designed ultrafast optical nonlinearity in a monolayer semiconductor
a COM fitting results of the plexciton reflection spectrum at an incident fluence of 2.0 µJ cm−2 with (orange solid line) and without (blue solid line) the EID effect. The red dashed line represents the pumped plexciton reflection spectrum at t = 100 fs, and the purple dashed line is the plexciton reflection spectrum unaffected by the pump excitation. b Plasmon–exciton coupling strength (g) and exciton resonance linewidth \((\gamma _{{{\mathrm{x}}}})\) parameters (dots) at various incident fluences obtained from COM fitting. The dashed lines are guides for data classification. c Comparison of the \({\Delta}\gamma _{{{\mathrm{x}}}}\)–g parameters (black dots) directly extracted from b with the \({\Delta}\gamma _{{{\mathrm{x}}}}\)–g relationship (blue solid line) indirectly derived from the bare WS2 excitons, in which \({\Delta}\gamma _{{{\mathrm{x}}}}\) denotes the broadening of the exciton resonance linewidth
