Fig. 4: Tuning plexcitons for controllable ultrafast NLA.
From: Interacting plexcitons for designed ultrafast optical nonlinearity in a monolayer semiconductor
a Reflection spectra, b differential reflection spectra, and (c) NLA experimental results of Ag ND–WS2 samples with different Al2O3 thicknesses. The dielectric interlayer Al2O3 was deposited on top of the ML WS2 via the atomic layer deposition technique. d Reflection spectra, e differential reflection spectra, and f NLA experimental results of Ag ND–WS2 samples with distinct disk diameters. The NLA experimental results of the bare substrate, Ag NDs, and WS2 were also measured and are presented in Fig. S22, providing a consistency check of our NLA experiments
