Fig. 5: Low ER in MVGB demultiplexing.

The bit ER caused by center offset (a) and background noise (b) in the demultiplexing process: comparison among the OAM beams with different mode spacings and tri-DoF MVGBs. of OAM beams (see Fig. 4)
The bit ER caused by center offset (a) and background noise (b) in the demultiplexing process: comparison among the OAM beams with different mode spacings and tri-DoF MVGBs. of OAM beams (see Fig. 4)