Fig. 7: Results of the NIST Special Publication 800-22 statistical tests.
From: Chaotic microlasers caused by internal mode interaction for random number generation
The random bits of 120 sequences, each with a size of 1 Mbit, were tested, and the worst P-value and proportion are presented. At significance level α = 0.01, the success proportion should be in the range of 0.99 ± 0.027, and the composite P-value should be larger than 0.0001 to ensure uniformity
