Fig. 10: Homogeneity of H-KTP.
From: Hydrothermal growth of KTiOPO4 crystal for electro-optical application
Optical Homogeneity of H-KTP (a) and H-RKTP (b); c Conoscopic interference image of a H-RKTP EO switch. Piezoelectric coefficient d33 distribution of d H-KTP and e H-RKTP; f 20 wafers with a thickness of 1 mm along the z-plane from beginning to end for confirming the ferroelectric domain of the crystal by measuring the piezoelectric coefficient d33; Distribution of DC conductivity at 70 °C of H-RKTP crystal g by traditional hydrothermal method and h micro-doping sustained-release hydrothermal technology (MSHT)
