Fig. 4: Aberration correction in a widefield 3-D structured illumination microscope (SIM).
From: Universal adaptive optics for microscopy through embedded neural network control
a Widefield images acquired A before and B-D after correction through different methods (as marked on the metric plot (b)). The second column shows corresponding deconvolved widefield images. The third column shows corresponding image spectra of the first column widefield images displayed in a logarithmic scale (as shown in the colorbar); dashed lines show the threshold where signal falls below the noise level. b The frequency threshold metric yT against the number of images, for two iterations of 3 N conv, ten iterations of ast2 MLAO and three iterations of 2 N MLAO. 3-D projections of 3-D reconstructed SIM image stack of (c) 10 µm and (d) 6 µm when by-passing AO and after five iterations of 2 N MLAO correction. d Square inserts show zoomed-in region for comparison. x-z and y-z sections are shown through lines 1 and 2. Insets to (a, c, d) show wavefronts corrected by the DM for each image acquisition; phase is shown on the adjacent scale bar
