Fig. 2: Measuring anomalous IR phonon enhancement of bilayer graphene in the exfoliated few-layer graphene on SiO2 substrate by using PiFM-KPFM. | Light: Science & Applications

Fig. 2: Measuring anomalous IR phonon enhancement of bilayer graphene in the exfoliated few-layer graphene on SiO2 substrate by using PiFM-KPFM.

From: Characterizing and controlling infrared phonon anomaly of bilayer graphene in optical-electrical force nanoscopy

Fig. 2

a Optical microscope image of exfoliated FLG. b Spontaneous Raman measurement of FLG by using far-field Raman spectroscope (Alpha 300 from Witec). c Topography, PiFM images at (d). 1570 cm−1 (off resonance), (e). 1584 cm−1 (on resonance) (f). 1590 cm−1 (off resonance) and (g). Contact potential difference map of the sample. The white scale bar is 4 μm. h Calculation of real part of relative conductivity of FLG near 0.2 eV with respect to stacking structures from previous study26. i Normalized PiFM responses with respect to the number of layers. j Normalized PiFM spectra on each cross in the topography. k Calibrated work function and VCPD with respect to the number of layers. All the normalizations are conducted by the PiFM signal of substrate (SiO2)

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