Fig. 4: Visualizing the subsurface structure of extrinsically stacked FLG. | Light: Science & Applications

Fig. 4: Visualizing the subsurface structure of extrinsically stacked FLG.

From: Characterizing and controlling infrared phonon anomaly of bilayer graphene in optical-electrical force nanoscopy

Fig. 4

a Optical image. The orange dashed line is the overlapped area. b Topography of the red dashed rectangular region in Fig. 4a. PiFM images of the same region at (c). 1578 cm−1, (d). 1580 cm−1, (e). 1582 cm−1 and (f). 1588 cm−1. The white scale bar is 4 μm. g Normalized PiFM spectral shift on the crack. h Sketch of infrared phonon shift of layered graphene with respect to the compress or tensile strains. All the normalizations are conducted by the PiFM signal of substrate (SiO2)

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