Fig. 2: Superposition of broadband diffraction via PSF mapping.
From: Ultra-simplified diffraction-based computational spectrometer
a The coherent monochromatic diffraction Im by a 633 nm band-filter. b The broadband diffraction IB captured by a wide spectrum illumination. c The measured spectrum (solid curve), the calculated power spectrum components (yellow dots), and the linear fitting with a uniform interval of 5 nm (red dots). d Recovered diffraction IB_hat from the calculated spectra power scatters. e Vertical line cuts along the center of the diffraction patterns, and red, black, and blue curves correspond to the patterns in subfigures a, b, and ds, respectively. f 3D distribution of an RR map between the measured diffraction IB and its prediction IB_hat, and the insert shows the zoom-in RR map in the region of blue boxes. All diffraction patterns are scaled to 1/2 power
