Fig. 6: Phase measurement for metalens working at 1560 nm.
From: Metalenses phase characterization by multi-distance phase retrieval
a, b Optical microscope images depicting the sample with defects and the defect-free sample. c, d Experimentally measured optical field distributions for the sample with defects and the defect-free sample. Phase distribution, wave aberration, and Zernike expansion coefficients are illustrated for the sample with defects in (e–g) and the defect-free sample in (h–j)
