Table 2 a Measured errors during the energy and delay scans, as well as the static reference for the beam pitch of the X-ray beam. b Measured errors during the energy and delay scans, as well as the static reference for the beam yaw of the X-ray beam

From: Dynamic motion trajectory control with nanoradian accuracy for multi-element X-ray optical systems via laser interferometry

a

Pitch error

Jitter: sigma (fit 95% CI) (μrad)

RMS (μrad)

Drift: moving median peak-peak (μrad)

Feedback

Off

On

Off

On

Off

On

Static reference

0.46 (±0.01)

 

0.54

 

0.79

 

Short delay scan

0.44 (±0.03)

0.49 (±0.02)

1.88

0.66

2.94

0.28

Full delay scan

0.46 (±0.02)

0.63 (±0.01)

1.27

0.66

4.22

0.68

Energy scan

0.49 (±0.03)

0.49 (±0.01)

1.60

0.86

4.07

1.26

b

Yaw error

Jitter: sigma (fit 95% CI) (μrad)

RMS (μrad)

Drift: moving median peak-peak (μrad)

Feedback

Off

On

Off

On

Off

On

Static reference

0.17 (±0.00)

 

0.33

 

0.18

 

Short delay scan

0.20 (±0.01)

0.21 (±0.01)

1.93

0.24

5.39

0.16

Full delay scan

0.22 (±0.01)

0.58 (±0.01)

4.98

0.67

10.34

1.22

Energy scan

0.37 (±0.02)

0.19 (±0.00)

4.23

0.88

18.75

1.78