Fig. 5: Defect characterization of CNPs in PEEM.
From: Weak-disturbance imaging and characterization of ultra-confined optical near fields
SEM (middle row) and PEEM images (bottom row) of CNPs with large slit widths (a) and “dirty” surfaces (b). The top rows are the schematic of the defects in the CNP. c SEM (top row) and PEEM images (middle and bottom rows) of a coupled nanowire triplet. The bottom row is the close-up PEEM image around the slits. d Sectional HR-TEM image of the sample in (c). The bottom row is a close-up sectional HR-TEM image around the slits
