Fig. 2: Comparison of force curves at critical points with trigger thresholds of 0.25 V and 0.55 V.
From: Controlled growth of a single carbon nanotube on an AFM probe
a Schematic diagram of the immersion depth of the cantilever inside the growth solution under different trigger thresholds. CNT probe growth schematic diagram with trigger thresholds of 0.25 V (b) and 0.55 V (d); the corresponding force curves (c) and (e)
