Fig. 1

Material characterization of SF substrates with different β-sheet contents. a, b FTIR absorbance spectra (a) of the amide I region (between 1 695 and 1 595 cm−1) obtained from different SF substrates and (b) the β-sheet contents calculated by Fourier self-deconvolution from these spectra. c Surface topography observed by SEM and AFM. d Surface roughness values analyzed by AFM. e, f Surface wettability (e) determined by water contact angle measurement and (f) representative images of water droplets. Error bars represent one standard deviation. (*P < 0.05 and **P < 0.01)