Table 4 List of standards applicable to different microscopy techniques and sample preparations
From: Quality control methods in musculoskeletal tissue engineering: from imaging to biosensors
Standard code/Reference | Standard title/description | Field of application |
|---|---|---|
ISO 21073:2019 | Microscopes—Confocal microscopes—Optical data of fluorescence confocal microscopes for biological imaging | Confocal microscopy |
ISO 18337:2015 | Surface chemical analysis—Surface characterization—Measurement of the lateral resolution of a confocal fluorescence microscope | Confocal microscopy |
ISO 25178-607:2019 | Geometrical product specifications (GPS)—Surface texture: Areal—Part 607: Nominal characteristics of noncontact (confocal microscopy) instruments | Confocal microscopy |
ISO 8039:2014 | Microscopes—Values, tolerances and symbols for magnification | Light microscopy |
ISO 10934-1:2002 | Optics and optical instruments—Vocabulary for microscopy—Part 1: Light microscopy | Light microscopy |
ISO 10934-2:2007 | Optics and optical instruments—Vocabulary for microscopy—Part 2: Advanced techniques in light microscopy | Light microscopy |
ISO 11039:2012 | Surface chemical analysis—Scanning probe microscopy—Measurement of drift rates | Scanning probe microscopy |
ISO 11775:2015 | Surface chemical analysis—Scanning probe microscopy—Determination of cantilever normal spring constants | Scanning probe microscopy |
ISO 18115-2:2013 | Surface chemical analysis—Vocabulary—Part 2: Terms used in scanning probe microscopy | Scanning probe microscopy |
ISO 11952:2019 | Surface chemical analysis—Scanning probe microscopy – Determination of geometric quantities using SPM: Calibration of measuring systems | Scanning probe microscopy |
ISO 27911:2011 | Surface chemical analysis—Scanning probe microscopy—Definition and calibration of the lateral resolution of a near-field optical microscope | Scanning probe microscopy |
ISO 13095:2014 | Surface chemical analysis—Atomic force microscopy—Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurements | Atomic force microscopy |
ISO 21222:2020 | Surface chemical analysis—Scanning probe microscopy—Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method | Scanning probe microscopy |
ISO 17025 | Testing and calibration laboratories | General |
ISO 13322-1:2014 | Particle size analysis—Image analysis methods—Part 1: Static image analysis methods | image analysis |
ISO 14887:2000 | Sample preparation—Dispersing procedures for powders in liquids | Sample preparation |
ISO 14488:2007 | Particulate materials—Sampling and sample splitting for the determination of particulate properties | Sample preparation |
