Fig. 3: Cross-sectional transmission electron microscopy (TEM) analysis of the hybrid heterostructure. | NPG Asia Materials

Fig. 3: Cross-sectional transmission electron microscopy (TEM) analysis of the hybrid heterostructure.

From: Vertical monolithic integration of wide- and narrow-bandgap semiconductor nanostructures on graphene films

Fig. 3

a Bright-field and b high-resolution (HR)-TEM images of the hybrid heterostructures near the ZnO nanorod/multilayer graphene (MLG)/InAs nanorod interfaces. Diffraction patterns acquired using a selective aperture size of 150 nm near the c ZnO nanorod, d InAs nanorod, and e ZnO/MLG/InAs interfaces. Plan-view TEM structural analysis of the heterostructure. f Plan-view HR-TEM image showing overlap of InAs and ZnO nuclei. g Corresponding fast Fourier transform of f.

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